NEW METHODS OF HIGH-SENSITIVITY, HIGH-RESOLUTION INSTRUMENTATION FOR SPECTROSCOPIC, ANGULAR AND POLARIZATION MEASUREMENTS IN THE EUV, SXR AND X-RAY RANGES

We have created new applications of experimental instrumentation for d iagnostics of hot plasma and studies of interaction of multicharged io n beams with matter (atoms, ions, molecules, microstructures, surfaces , solids) based on both glass capillary devices and multilayer mirrors or crystals, where glass capillary devices provide guiding, focusing and polarization analysis of short wavelength radiation with a large b andwidth, and multilayer mirrors or crystals optical elements are used for dispersing, focusing and polarization sensitive studies of radiat ion within a narrow bandwidth. In particular we report here about the development and test of such optical diagnostic devices for the spectr al range 0.1nm < lambda < 100nm. This type of micro-instrumentation is very suitable also for 2D, 3D and multiparameter applications.