QUANTITATIVE COMPARISON OF STRUCTURAL PARAMETERS OF MAGNETIC MULTILAYERS OBTAINED BY DIFFRACTION METHODS AND BY DIRECT IMAGING TECHNIQUES .1. INTERLAYER STRUCTURE

Authors
CHLADEK M VALVODA V DORNER C ERNST W
Citation
M. Chladek et al., QUANTITATIVE COMPARISON OF STRUCTURAL PARAMETERS OF MAGNETIC MULTILAYERS OBTAINED BY DIFFRACTION METHODS AND BY DIRECT IMAGING TECHNIQUES .1. INTERLAYER STRUCTURE, Journal of magnetism and magnetic materials, 172(3), 1997, pp. 209-217
Citations number
8
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Journal of magnetism and magnetic materials → ACNP
ISSN journal
03048853
Volume
172
Issue
3
Year of publication
1997
Pages
209 - 217
Database
ISI
SICI code
0304-8853(1997)172:3<209:QCOSPO>2.0.ZU;2-X
Abstract
The interlayer structure of a magnetic multilayer [Ni30Co70(5.6 Angstr om)/Au(15 Angstrom)](16) has been analyzed by low-angle X-ray diffract ion (LXRD), transmission electron microscopy (TEM) and by scanning tun neling microscopy (STM). The values of total thickness, sublayer thick ness, multilayer periodicity length, interface roughness and in-plane correlation length obtained by LXRD agree very well with the values re ceived from a detail analysis of TEM micrographs and STM scans. The pr esented results confirm reliability of XRD structural parameters as de rived from specular reflectivity, area scans and Omega scan data measu rements, The comparison has been found very helpful in evaluation of a real physical meaning of these interlayer structural parameters.