TITANIUM THIN-FILM GROWTH ON SMALL AND LARGE MISFIT SUBSTRATES

Authors
Citation
M. Huth et Cp. Flynn, TITANIUM THIN-FILM GROWTH ON SMALL AND LARGE MISFIT SUBSTRATES, Applied physics letters, 71(17), 1997, pp. 2466-2468
Citations number
15
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
71
Issue
17
Year of publication
1997
Pages
2466 - 2468
Database
ISI
SICI code
0003-6951(1997)71:17<2466:TTGOSA>2.0.ZU;2-K
Abstract
The influence of lattice misfit on the growth of Ti (0001) is investig ated in the limit of small negative (-1%) and large positive (+6.8%) m isfit by choosing MgO (111) and Al2O3 (0001) as substrate materials. R eflection high energy electron diffraction imaging and intensity measu rements during growth reveal two-dimensional nucleation of islands on MgO, in contrast to three-dimensional nucleation on Al2O3. X-ray analy sis of 30-nm-thick films on MgO shows a two-component line shape in tr ansverse scans of the (0002) and (0004) reflections, pointing to a hig h degree of structural coherence in the weak disorder limit. The surfa ce morphology of films grown on MgO depends strongly on the substrate temperature during growth. (C) 1997 American Institute of Physics. [S0 003-6951(97)03243-9].