MATERIAL CHARACTERISTICS OF PEROVSKITE MANGANESE OXIDE THIN-FILMS FORBOLOMETRIC APPLICATIONS

We are optimizing thin films of perovskite manganese oxides for bolome tric applications. We have studied the relevant material characteristi cs of several members of this family namely, La0.7Ba0.3MnO3, La0.7Sr0. 3MnO3, La0.7Ca0.3MnO3, and Nd0.7Sr0.3MnO3. Here, we discuss issues rel ated to the choice of material, the influence of deposition parameters , and postdeposition heat treatments on the relevant characteristics s uch as the resistivity-peak temperature (T-p) and the temperature coef ficient of resistance (TCR), For a given material, a higher peak tempe rature implies a larger temperature coefficient of resistance, In cont rast, on comparing different material systems, the TCR tends to decrea se as T-p increases. (C) 1997 American Institute of Physics. [S0003-69 51(97)01743-9].