ELECTRONIC-STRUCTURE CRITICAL PARAMETERS FROM FINITE-SIZE-SCALING

Citation
Jp. Neirotti et al., ELECTRONIC-STRUCTURE CRITICAL PARAMETERS FROM FINITE-SIZE-SCALING, Physical review letters, 79(17), 1997, pp. 3142-3145
Citations number
28
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
79
Issue
17
Year of publication
1997
Pages
3142 - 3145
Database
ISI
SICI code
0031-9007(1997)79:17<3142:ECPFF>2.0.ZU;2-O
Abstract
We present finite-size scaling and phenomenological renormalization eq uations for calculations of the critical points of the electronic stru cture of atoms and molecules. Results show that the method is efficien t and very accurate for estimating the critical screening length for o ne-electron screened Coulomb potentials and the critical nuclear charg e for two-electron atoms. The method has potential applicability for m any-body quantum systems. [S0031-9007(97)04408-6].