We investigate the transition from two- to three-dimensional growth of
thin InAs films on InP by chemical beam epitaxy. This transition is s
hown to strongly depend on growth temperature and on the misorientatio
n-or the presence of surface steps - on the InP surface where the InAs
film is deposited. Low temperature photoluminescence measurements on
InP-InAs-InP quantum well structures and atomic force microscopy analy
sis of InAs-InP structures indicate different islanding behaviors for
substrates with different misorientations, the onset of islanding proc
ess occurring earlier for misoriented than for nominal substrates. The
shape and distribution of the islands indicate the existence of a ste
p edge barrier altering the diffusion dynamics on the surface. Low gro
wth temperature is shown to delay islanding for a fixed deposition tim
e and also limit island formation to certain regions of the sample whe
re smooth corrugations (slope similar to 1 degrees) are observed. (C)
1997 Elsevier Science B.V.