ANALYSIS OF SURFACE MOLECULAR-MOTION OF AMORPHOUS POLYMERIC SOLIDS ONTHE BASIS OF SCANNING FORCE MICROSCOPY AND X-RAY PHOTOELECTRON-SPECTROSCOPY

Citation
T. Kajiyama et al., ANALYSIS OF SURFACE MOLECULAR-MOTION OF AMORPHOUS POLYMERIC SOLIDS ONTHE BASIS OF SCANNING FORCE MICROSCOPY AND X-RAY PHOTOELECTRON-SPECTROSCOPY, Proceedings of the Japan Academy. Series B Physical and biological sciences, 73(7), 1997, pp. 132-137
Citations number
18
Categorie Soggetti
Multidisciplinary Sciences",Biology
ISSN journal
03862208
Volume
73
Issue
7
Year of publication
1997
Pages
132 - 137
Database
ISI
SICI code
0386-2208(1997)73:7<132:AOSMOA>2.0.ZU;2-G
Abstract
Surface molecular motions of amorphous polymeric solids have been dire ctly measured on the basis of lateral force microscopic (LFM), scannin g viscoelasticity microscopic (SVM) and differential X-ray photoelectr on spectroscopic (D-XPS) studies. SVM and LFM measurements of monodisp erse polystyrene (PS) films revealed that, in the case of the number-a verage molecular weight, Mn less than ca, 30k, the surface uas in a gl ass-rubber transition state at room temperature even though the bulk g lass transition temperature, Tg was far above room temperature, The ac tive molecular motion at the polymeric solid surface can be interprete d mainly in terms of excess free volume near the surface region induce d by the surface segregation of chain end groups, which was confirmed by dynamic secondary ion mass spectroscopy (DSIMS). D-XPS measurement revealed that the surface Tg for the poly(styrene-block-methyl methacr ylate) diblock copolymer films increased gradually with an increase in depth from the air/polymer interface.