D. Baxter et al., POLARIZATION-DEPENDENT PHENOMENA IN THE REFLECTIVITY SPECTRA OF SEMICONDUCTOR QUANTUM MICROCAVITIES, Physical review. B, Condensed matter, 56(16), 1997, pp. 10032-10035
Angular-dependent reflectivity techniques are employed to probe the ex
citon-polariton states of a semiconductor quantum microcavity. The spe
ctra exhibit marked polarization dependence, with the energies, line w
idths, and intensities all differing between transverse-electric and t
ransverse-magnetic polarizations, consistent with the predictions of t
ransfer-matrix simulations. In addition, anomalous narrowing of the sp
ectra on resonance, broadening of the cavity mode by interaction with
exciton continuum states and interaction of the cavity mode with quant
um-well excited-state transitions are reported. [S0163-1829(97)52040-6
].