FABRICATION OF SIGE QUANTUM DOTS ON A SI(100) SURFACE

Citation
Vl. Thanh et al., FABRICATION OF SIGE QUANTUM DOTS ON A SI(100) SURFACE, Physical review. B, Condensed matter, 56(16), 1997, pp. 10505-10510
Citations number
37
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
56
Issue
16
Year of publication
1997
Pages
10505 - 10510
Database
ISI
SICI code
0163-1829(1997)56:16<10505:FOSQDO>2.0.ZU;2-T
Abstract
This paper reports a method to produce SiGe quantum dots on a Si(100) surface, which is based on the selective adsorption effect of hydride molecules on a partially hydrogen-terminated Si(100) surface. It is sh own that etching of Si(100) surfaces for a limited time in ammonium fl uoride (NH4F) solution initially produces an atomically flat and dihyd ride-terminated surface and that further etching leads to the formatio n of microscopic (111) facets which are regularly distributed along th e surface. Hydrogen atoms are found to desorb completely from dihydrid e sites at similar to 400 degrees C while those from monohydrides rema in stable up to 650 degrees C. Hence, we show that in the temperature range of 400-650 degrees C, SiGe growth occurs only on the sites that were previously terminated by dihydrides, i.e., free of hydrogen. We d emonstrate that SiGe dots formed by using this approach are much small er in size (similar to 400 Angstrom) and more uniform than dots formed by the strain-induced growth mode transition.