GRATING INTERFEROMETRY WITH A SEMICONDUCTOR LIGHT-SOURCE

Citation
A. Kozlowska et al., GRATING INTERFEROMETRY WITH A SEMICONDUCTOR LIGHT-SOURCE, Applied optics, 36(31), 1997, pp. 8116-8120
Citations number
16
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
36
Issue
31
Year of publication
1997
Pages
8116 - 8120
Database
ISI
SICI code
0003-6935(1997)36:31<8116:GIWASL>2.0.ZU;2-A
Abstract
The properties of a fiber-optic-based grating interferometer with a la ser diode as the light source are described. The influence of effects such as wavelength shift, Line broadening, and made hopping on the qua lity of an interference pattern is investigated both theoretically and experimentally. Introduction of carrier fringes in the interference p attern through the injection-current-induced modulation of a laser dio de is shown. The requirements for temporal coherence properties of a l ight source in grating interferometry are given. (C) 1997 Optical Soci ety of America.