LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE FOR INVESTIGATIONS IN MAGNETIC-FIELDS

A scanning tunneling microscope (STM), equipped with an attachment for in situ sample cleavage and capable of low-temperature measurements i n the presence of a strong magnetic field, is described, Details of th e constructions of the cryostat insert, mechanical head, and cleavage mechanism are described. Performance of the STM is demonstrated by the results of investigation of the single-crystal surface of InAs, Ga, a nd high-temperature superconductor BiSiCaCuO ceramics. The tunneling g ap in the magnetic field is about 15 nm/T, and the transverse STM prob e point shift, about 3 nm/T.