WELL-WIDTH DEPENDENT STUDIES OF INGAN-GAN SINGLE-QUANTUM WELLS USING TIME-RESOLVED PHOTOLUMINESCENCE TECHNIQUES

Citation
Ck. Sun et al., WELL-WIDTH DEPENDENT STUDIES OF INGAN-GAN SINGLE-QUANTUM WELLS USING TIME-RESOLVED PHOTOLUMINESCENCE TECHNIQUES, IEEE journal of selected topics in quantum electronics, 3(3), 1997, pp. 731-738
Citations number
30
Categorie Soggetti
Engineering, Eletrical & Electronic",Optics
ISSN journal
1077260X
Volume
3
Issue
3
Year of publication
1997
Pages
731 - 738
Database
ISI
SICI code
1077-260X(1997)3:3<731:WDSOIS>2.0.ZU;2-J
Abstract
We present a well-width-dependent study of In-GaN-GaN single-quantum w ells using a time-resolved photoluminescence (PL) technique. At room t emperature (RT), carrier recombination was found to be dominated by in terface-related nonradiative processes. The dominant radiative recombi nation at RT was through band-to-band free carriers. For the sample gr own at a higher growth rate, we observed a longer luminescence lifetim e, which was attributed to an improved quantum-well (QW) interface. At low temperatures, the carrier recombination was found to be dominated by radiative recombination through a combination of free excitons, bo und excitons, and free carriers. A decrease of radiative exciton lifet ime was observed with decreased QW thickness.