CALCULATION OF THE SURFACE STRESS ANISOTROPY FOR THE BUCKLED SI(001)(1X2) AND P(2X2) SURFACES

Authors
DABROWSKI J PEHLKE E SCHEFFLER M
Citation
J. Dabrowski et al., CALCULATION OF THE SURFACE STRESS ANISOTROPY FOR THE BUCKLED SI(001)(1X2) AND P(2X2) SURFACES, Physical review. B, Condensed matter, 49(7), 1994, pp. 4790-4793
Citations number
27
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physical review. B, Condensed matter → ACNP
ISSN journal
01631829
Volume
49
Issue
7
Year of publication
1994
Pages
4790 - 4793
Database
ISI
SICI code
0163-1829(1994)49:7<4790:COTSSA>2.0.ZU;2-Z
Abstract
Knowledge of the surface stress anisotropy is a prerequisite for the d escription of the mesoscopic structure of stepped Si(001) surfaces. Ho wever, it is known that results from first-principles calculations for the (1 x 2) reconstructed surface surpass the experimental value by a bout a factor of 2. We demonstrate that this discrepancy is primarily not an extrinsic effect due to surface defects but a consequence of th e elastic interaction between the dimers on the defect free surface.