RATE OF FRACTURE AND FRACTURE PROGRESSION OF THE TELECTRONICS ACCUFIXATRIAL LEAD J-WIRE - IMPLICATIONS FOR PATIENT-MANAGEMENT

Authors
KAWANISHI DT BRINKER JA REEVES RC KAY GN GROSS JN FEE J
Citation
Dt. Kawanishi et al., RATE OF FRACTURE AND FRACTURE PROGRESSION OF THE TELECTRONICS ACCUFIXATRIAL LEAD J-WIRE - IMPLICATIONS FOR PATIENT-MANAGEMENT, Circulation, 96(8), 1997, pp. 3893-3893
Citations number
NO
Categorie Soggetti
Peripheal Vascular Diseas",Hematology
Journal title
Circulation → ACNP
ISSN journal
00097322
Volume
96
Issue
8
Year of publication
1997
Supplement
S
Pages
3893 - 3893
Database
ISI
SICI code
0009-7322(1997)96:8<3893:ROFAFP>2.0.ZU;2-M