ELECTRON-CAPTURE AND LOSS PROCESSES IN THE INTERACTION OF HYDROGEN, OXYGEN, AND FLUORINE-ATOMS AND NEGATIVE-IONS WITH A MGO(100) SURFACE

Citation
S. Ustaze et al., ELECTRON-CAPTURE AND LOSS PROCESSES IN THE INTERACTION OF HYDROGEN, OXYGEN, AND FLUORINE-ATOMS AND NEGATIVE-IONS WITH A MGO(100) SURFACE, Physical review letters, 79(18), 1997, pp. 3526-3529
Citations number
29
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
79
Issue
18
Year of publication
1997
Pages
3526 - 3529
Database
ISI
SICI code
0031-9007(1997)79:18<3526:EALPIT>2.0.ZU;2-9
Abstract
A study of electron capture and loss processes during the scattering o f H, O, and F atoms and anions on a MgO(100) surface is described. Lar ge fractions of anions in the scattering of atoms are observed, indica ting the existence of an efficient electron capture process. This is a scribed to a nonresonant, localized charge exchange mechanism between an atom and a MgO lattice oxygen anion. This charge transfer becomes p ossible because of anion level shifts in the Madelung field. The exist ence of an electron loss channel is demonstrated using incident anions and is ascribed to loss to the conduction band or Mg cations.