J. Sonsky et al., STUDY OF QUASI-CRYSTALLINE THIN-FILMS BASED ON AL-PD-MN AND AL-CU-FE PREPARED BY PLD, Czechoslovak journal of Physics, 47(10), 1997, pp. 1019-1024
Thin films of Al-70 Pd-20 Mn-10 Al-63 Cu-25 Fe-12 Al-70 Pd-20 Mn-10 an
d Al-63 Cu-25 Fe-12 were grown by laser ablation on fused silica at se
t of deposition temperature -196 degrees C, room temperature 165 degre
es C and 350 degrees C. Structure, morphology, resistivity and refract
ive index of prepared layers were studied.