STUDY OF QUASI-CRYSTALLINE THIN-FILMS BASED ON AL-PD-MN AND AL-CU-FE PREPARED BY PLD

Citation
J. Sonsky et al., STUDY OF QUASI-CRYSTALLINE THIN-FILMS BASED ON AL-PD-MN AND AL-CU-FE PREPARED BY PLD, Czechoslovak journal of Physics, 47(10), 1997, pp. 1019-1024
Citations number
16
Categorie Soggetti
Physics
ISSN journal
00114626
Volume
47
Issue
10
Year of publication
1997
Pages
1019 - 1024
Database
ISI
SICI code
0011-4626(1997)47:10<1019:SOQTBO>2.0.ZU;2-A
Abstract
Thin films of Al-70 Pd-20 Mn-10 Al-63 Cu-25 Fe-12 Al-70 Pd-20 Mn-10 an d Al-63 Cu-25 Fe-12 were grown by laser ablation on fused silica at se t of deposition temperature -196 degrees C, room temperature 165 degre es C and 350 degrees C. Structure, morphology, resistivity and refract ive index of prepared layers were studied.