PHOTOINDUCED EFFECT IN ALPHA-ALUMINA - CHARACTERIZATION BY TSEE METHOD

Citation
P. Iacconi et al., PHOTOINDUCED EFFECT IN ALPHA-ALUMINA - CHARACTERIZATION BY TSEE METHOD, Physica status solidi. a, Applied research, 163(2), 1997, pp. 337-348
Citations number
28
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
00318965
Volume
163
Issue
2
Year of publication
1997
Pages
337 - 348
Database
ISI
SICI code
0031-8965(1997)163:2<337:PEIA-C>2.0.ZU;2-L
Abstract
A study of Thermally Stimulated Exoelectron Emission (TSEE) obtained f rom alpha-alumina samples after X-ray irradiation at 300 K followed by UV elicitation at 77 K is reported. The observed results, called phot oinduced TSEE (PITSEE) are compared with similar phenomena occurring i n thermoluminescence (PITL) and thermally stimulated conductivity (PIT SC). Under these conditions, two peaks at about 225 and 270 K are rege nerated. The process of regeneration is described in terms of hole tra nsfer and a two-centre Auger mechanism.