ELECTRONIC-PROPERTIES OF THE METAL-XEROGEL INTERFACE STUDIED BY IMPEDANCE SPECTROSCOPY, AC AND DC POLARIZATION

Results of investigations of processes on the metal-xerogel interface are presented. Thin film xerogels of polyvanadium-molybdenum acid H2V1 1.5Mo0.5O30.7. 8.4H(2)O were prepared by a chemical synthesis techniqu e, mixing V2O5 and MoO3 in H2O2 in suitable proportion at 273 K and he ating the solution to a temperature of 353 K. The electronic processes were studied by impedance spectroscopy (Cole-Cole diagrams), ac and d c polarization methods. The results of the investigations indicated th at near the electrodes a high resistance layer was formed. The voltage -current characteristics of the xerogels can be explained by the Poole -Frenkel thermoelectronic ionization mechanism in this layer and an io nization energy of the carriers of Delta E-0 = 0.23 eV was determined.