Very-low-energy electron diffraction (VLEED) intensities from clean Cu
(111) surface have been measured in detail in the energy range 15 to 3
5 eV by low-energy electron microscope. Corresponding theoretical I-V
curves are obtained in good agreement with experimental data when the
anisotropy of the electron attenuation is taken into account. The coin
cidence of the peaks in the I-V curves at normal incidence with two ki
nds oi energy gaps of the electron band structure of the copper crysta
l (E-k parallel to=0) is interpreted. The small width of the resonance
peak in the I-V curve at normal incidence is explained in terms of el
ectron surface channeling. VLEED thus provides information about the u
noccupied part of the electron band structure of copper which compleme
nts that obtained from angular resolved photoemission.