Raman spectra have been investigated for CuInSe2 polycrystalline thin
films prepared by chemical spray pyrolysis. The A(1) mode Raman peak a
t 174 cm(-1), the dominant peak in CuInSe2 with a chalcopyrite structu
re, and a peak at 182 cm(-1) have been observed. The A(1) mode peak is
dominant for Cu-rich films and stoichiometric films deposited at high
substrate temperature. On the other hand, the 182 cm(-1) peak is domi
nant for In-rich films and stoichiometric films deposited at low subst
rate temperature. By comparing the Raman results with the X-ray diffra
ction measurements, the peak at 182 cm(-1) is found to be characterist
ic of CuInSe2 with a sphalerite structure.