K. Ishikiriyama et al., MELTING OF INDIUM BY TEMPERATURE-MODULATED DIFFERENTIAL SCANNING CALORIMETRY, Journal of thermal analysis, 50(4), 1997, pp. 547-558
The melting and crystallization of a sharply melting standard has been
explored for the calibration of temperature-modulated differential sc
anning calorimetry, TMDSC. Modulated temperature and heat flow have be
en followed during melting and crystallization of indium. It is observ
ed that indium does not supercool as long as crystal nuclei remain in
the sample when analyzing quasi-isothermally with a small modulation a
mplitude. For standard differential scanning calorimetry, DSC, the mel
ting and crystallization temperatures of indium are sufficiently diffe
rent not to permit its use for calibration on cooling, unless special
analysis modes are applied. For TMDSC with an underlying heating rate
of 0.2 K min(-1) and a modulation amplitude of 0.5-1.5 K at periods of
30-90 s, the extrapolated onsets of melting and freezing were within
0.1 K of the known melting temperature of indium. Further work is need
ed to separate the effects originating from loss of steady state betwe
en sample and sensor on the one hand and from supercooling on the othe
r.