SCANNING ELECTRON-MICROSCOPY OF MUSEUM TE XTILES - METHODICAL ASPECTS

Authors
KRAPUKHIN VV KAGAN NB KACHANOVA IM
Citation
Vv. Krapukhin et al., SCANNING ELECTRON-MICROSCOPY OF MUSEUM TE XTILES - METHODICAL ASPECTS, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 58(1), 1994, pp. 200-204
Citations number
2
Categorie Soggetti
Physics
Journal title
Izvestia Akademii nauk SSSR. Seria fiziceskaa → ACNP
ISSN journal
03676765
Volume
58
Issue
1
Year of publication
1994
Pages
200 - 204
Database
ISI
SICI code
0367-6765(1994)58:1<200:SEOMTX>2.0.ZU;2-P