T. Sugaya et al., DIFFERENCE IN-DIFFUSION LENGTH OF GA ATOMS UNDER AS-2 AND AS-4 FLUX IN MOLECULAR-BEAM EPITAXY, JPN J A P 1, 36(9A), 1997, pp. 5670-5673
The surface diffusion length of Ga adatoms under As-2 or As-4 flux has
been measured using V-grooved GaAs (001) substrates in molecular beam
epitaxy: The diffusion length on the (001) surface toward the [110] d
irection, of Ga adatoms under As-2 flux is about half of that under As
-4 flux. A smaller number of Ga atoms under As-2 flux migrate to the (
001) ridge surface from the sidewall surface than those under As-4 flu
x. Furthermore, the Al0.6Ga0.4As layer on the V-grooved GaAs substrate
grown under As-2 Bur preserve the V-shape, whereas the V-shape cannot
be preserved during the growth under As-4 flux. The GaAs quantum wire
structures which have Al0.6Ga0.4As barrier layeres are fabricated und
er As-2 flux.