APPLICATION OF CHEMICAL-STATE MAPPING TECHNIQUE WITH ELECTRON-PROBE X-RAY MICROANALYZER FOR BISRCACUO SUPERCONDUCTOR

High resolution O-K alpha X-ray spectra obtained by electron probe X-r ay microanalysis (EPMA) have been found to provide a detailed insight into the crystal structure of specimens. A practical approach for digi tal color mapping of the crystal structures is proposed, which uses th e ratio of the intensities of two specific wavelengths to represent th e spectral shape. An application of this approach to digital mapping f or a BiSrCaCuO superconductor is presented. The results lead to a more comprehensive understanding of the micro-crystallinity of fine specim ens.