SOFTWARE FOR FUNDAMENTAL PARAMETER METHOD IN ENERGY-DISPERSIVE X-RAY-FLUORESCENCE ANALYSIS OF INTERMEDIATE THICKNESS SAMPLES

Citation
B. Holynska et al., SOFTWARE FOR FUNDAMENTAL PARAMETER METHOD IN ENERGY-DISPERSIVE X-RAY-FLUORESCENCE ANALYSIS OF INTERMEDIATE THICKNESS SAMPLES, Applied radiation and isotopes, 45(4), 1994, pp. 409-414
Citations number
5
Categorie Soggetti
Nuclear Sciences & Tecnology","Radiology,Nuclear Medicine & Medical Imaging
Journal title
Applied radiation and isotopes
ISSN journal
09698043 → ACNP
Volume
45
Issue
4
Year of publication
1994
Pages
409 - 414
Database
ISI
SICI code
0969-8043(1994)45:4<409:SFFPMI>2.0.ZU;2-E
Abstract
A PC-based program called ETM has been written for routine Energy Disp ersive x-Ray Fluorescence (EDXRF) analysis using the fundamental param eter method. The program can be applied for different sources of prima ry radiation. Samples to be analyzed may contain unknown matrix. Simpl e, non-iterative algorithm is used for correction of the absorption an d enhancement effects. A special procedure is applied for calculating the corrected concentrations of Pb and As when both elements are prese nt in a sample. The results of analysis of three standard reference ma terials for three sources of primary radiation are presented. The prog ram has been coded in Turbo Pascal 6.0.