Es. Zolotovitskaya et al., ATOMIC-EMISSION SPECTRUM ANALYSIS OF ALUMINUM-OXIDE USING AN ARGON ARC PLASMATRON, Journal of analytical chemistry, 52(11), 1997, pp. 1099-1102
It is shown that an argon are plasmatron can be used for direct atomic
-emission analysis of aluminum oxide. Conditions for powder spraying i
nto the plasma torch were optimized. Torch zones exhibiting maximum us
eful signals of atomic and ionic lines that are used as analytical one
s were determined. The limits of determination for simultaneous multie
lement analysis (vaporization of 75 mg of samples) are (1-7) x 10(-6)%
for Mg, Ca, Sr, Ba, Mn, and Ga; (1-3)x10(-5)% for Cr, Ni, Mo, Fe, Ti,
V, and Y; and (1-2)x10(-4)% for Si, Pb, Sn, and Bi. The advantages of
the use of a plasmatron as compared to an are Light source for analyz
ing aluminum oxide are simple sample treatment, low limits of detectio
n, high reliability, and high rapidity of analysis.