RAMAN-SPECTRA OF GE0.11SI0.89 STRAINED QUANTUM WIRES

Citation
Sc. Jain et al., RAMAN-SPECTRA OF GE0.11SI0.89 STRAINED QUANTUM WIRES, Semiconductor science and technology, 12(11), 1997, pp. 1507-1510
Citations number
11
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
ISSN journal
02681242
Volume
12
Issue
11
Year of publication
1997
Pages
1507 - 1510
Database
ISI
SICI code
0268-1242(1997)12:11<1507:ROGSQW>2.0.ZU;2-C
Abstract
We have calculated the Raman spectrum of strained Ge0.11Si0.89 wires s andwiched between Si layers. Because of the relatively large width and penetration depth of the laser beam the volume sampled by the beam is large. Using the strain components calculated by the finite element m ethod, the strain induced Raman shifts and Raman spectra were calculat ed at each point in the volume sampled. The final spectrum obtained by superposing these spectra shows excellent agreement with the observed spectrum. The strain induced shift measured by micro Raman in nonunif ormly strained solids does not give strain values in a straightforward manner.