FREQUENCY-DEPENDENCE ON TEMPERATURE OF AC CONDUCTANCE IN SILICON DETECTORS

Citation
N. Croitoru et al., FREQUENCY-DEPENDENCE ON TEMPERATURE OF AC CONDUCTANCE IN SILICON DETECTORS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 132(1), 1997, pp. 199-206
Citations number
14
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
132
Issue
1
Year of publication
1997
Pages
199 - 206
Database
ISI
SICI code
0168-583X(1997)132:1<199:FOTOAC>2.0.ZU;2-N
Abstract
Measurements of the real and imaginary parts of admittance Y as a func tion of frequency omega, up to 10(3) kHz at temperatures 10 K less tha n or equal to T less than or equal to 270 K, were performed. The corre sponding electric circuit model of Y(omega) was calculated. A quadrati c dependence of G(omega) on omega for 40 K less than or equal to T les s than or equal to 270 K was obtained. At lower temperatures, T less t han or equal to 40 K, a dependence of G on omega '' was obtained, wher e n < 2. It was shown that the value of omega where n < 2 (omega = ome ga(c)) depends on T: with decreasing T the value of omega(c) decreases . For T less than or equal to 20 K freeze out of free carriers produce s a strong reduction of G and independence on omega. It was shown that the resistivity rho is a function of T and two types of behaviour app ear (phonon scattering and freeze-out phenomena) in the interval 10 K less than or equal to T less than or equal to 270 K. (C) 1997 Elsevier Science B.V.