The low frequency behavior of the generation-recombination noise in th
e homogeneous semiconductors is investigated. The form of Lorentz law
for spectral density of noise at low frequencies is made more precise.
It is shown that at superflow frequencies the spectrum of generation-
recombination noise changes into the 1/f-law. The characteristic frequ
ency of this change depends on the temperature and dimensions of the s
ample.