TS-1/TS-2 intergrowth structures have been synthesized from hydrogels
containing binary mixtures of tetrapropylammonium and tetrabutylammoni
um hydroxides (TPAOH/TBAOH). TPA+ cations were shown to be selectively
involved in the crystallization process of titanosilicates. These str
uctures were interpreted as a layer sequence in which the prevailing i
-type stacking was interrupted by sigma-type stacking faults. The latt
er were quantified by a probability of occurrence, p, estimated from X
-ray diffraction patterns. p was also calculated from C-13 CP/MAS n.m.
r. spectra of as-synthesized samples. in the present case, an excellen
t agreement was found between the results obtained by both techniques.
The corresponding silicalites 1 and 2 have been characterized using S
i-29 MAS n.m.r., which has clearly revealed the presence of stacking f
aults.