A passive integrated optical waveguide refractometer based on bendloss
changes in a spiral-shaped channel waveguide is proposed and fabricat
ed in Si3N4/SiO2 technology. The experimentally determined performance
and the theoretical predictions, based on a simple model for so-calle
d ''whispering gallery modes,'' agree very well. The minimum detectabl
e refractive index change was measured to be Delta n=1.3x10(-5). (C) 1
997 American Institute of Physics.