V. Betz et al., INPLANE ALIGNED PR6O11 BUFFER LAYERS BY ION-BEAM-ASSISTED PULSED-LASER DEPOSITION ON METAL SUBSTRATES, Applied physics letters, 71(20), 1997, pp. 2952-2954
Biaxially aligned praseodymium oxide (Pr6O11) thin films were prepared
by ion-beam assisted laser deposition on mechanically polished metal
alloy substrates. A low divergence rf plasma source was used as an ass
isting source. Deposited films showed (001) oriented film growth with
a strong biaxial alignment in the film plane. The degree of in-plane o
rientation dependent on ion-to-atom ratio and ion bombardment angle wa
s studied. Planar ion channeling along the {110} planes is used to exp
lain the observed alignment features. At an ion-to-atom ratio of 0.17
and an ion incident angle of 60 degrees, in-plane orientations of 16 d
egrees full width at half-maximum were obtained, Due to the low lattic
e mismatch (0.3%) to YBa2Cu3Ox films, the material could be an alterna
tive to the YSZ/CeO2 buffer layer system currently used for high criti
cal current carrying superconducting tapes. (C) 1997 American Institut
e of Physics.