The detection of coincidental emissions (electron-ion, ion-ion, photon
-ion) can enhance the amount of information available in desorption ti
me-of-flight mass spectrometry (TOF-MS) by identifying physical, chemi
cal and/or spatial correlations. This paper outlines the conditions fo
r coincidence measurements and the methodology for identifying correla
tions. Applications of coincidence-correlation mass spectrometry inclu
de the study of the composition and structure of polyatomic ions, the
process involved in ion production from solids and the chemical microh
omogeneity of surfaces. (C) 1997 John Wiley & Sons, Ltd.