DEVELOPMENT OF A RELIABLE MATERIALS BASE FOR SUPERCONDUCTING ELECTRONICS

Citation
Jp. Zhou et al., DEVELOPMENT OF A RELIABLE MATERIALS BASE FOR SUPERCONDUCTING ELECTRONICS, Journal of materials research, 12(11), 1997, pp. 2958-2975
Citations number
46
Categorie Soggetti
Material Science
ISSN journal
08842914
Volume
12
Issue
11
Year of publication
1997
Pages
2958 - 2975
Database
ISI
SICI code
0884-2914(1997)12:11<2958:DOARMB>2.0.ZU;2-V
Abstract
Careful studies of the corrosion, redox, galvanic, and oxygen evolutio n/uptake reactions associated with YBa2CU3O7-delta and related compoun ds have been completed. These studies have led to an understanding of the many factors that contribute to the poor material characteristics exhibited by these popular high-T-c phases. With knowledge of the stru cture-reactivity relationships, a powerful crystal engineering approac h has been developed that is capable of producing cation substituted v ersions of YBa2Cu3O7-delta; the resulting compounds therefrom produced exhibit markedly improved processability, oxygen stability, and durab ility characteristics. These materials have been combined in thin film structures so as to make prototype SNS junctions and SQUID sensors wh ich exhibit promising device performance characteristics.