NANO-SCLEROMETRY MEASUREMENTS OF SUPERHARD MATERIALS AND DIAMOND HARDNESS USING SCANNING FORCE MICROSCOPE WITH THE ULTRAHARD FULLERITE C-60TIP

Citation
V. Blank et al., NANO-SCLEROMETRY MEASUREMENTS OF SUPERHARD MATERIALS AND DIAMOND HARDNESS USING SCANNING FORCE MICROSCOPE WITH THE ULTRAHARD FULLERITE C-60TIP, Journal of materials research, 12(11), 1997, pp. 3109-3114
Citations number
19
Categorie Soggetti
Material Science
ISSN journal
08842914
Volume
12
Issue
11
Year of publication
1997
Pages
3109 - 3114
Database
ISI
SICI code
0884-2914(1997)12:11<3109:NMOSMA>2.0.ZU;2-W
Abstract
The new procedure for the hardness measurements of superhard materials including diamond using the scanning force microscope with the ultrah ard fullerite C-60 tip was developed. It is shown that diamond is plas tically deformed under the indentation by the ultrahard fullerite inde nter at room temperature, Now the correct measurements of diamond hard ness have become possible, The hardness values measured are 137 +/- 6 and 167 +/- 5 GPa for the diamond faces (100) and (111), respectively.