HIGH-RESOLUTION ELECTRON-MICROSCOPY OBSERVATION OF INTERFACIAL STRUCTURES IN NIAL-MATRIX IN-SITU COMPOSITES REINFORCED BY TIC PARTICULATES (VOL 12, PG 1790, 1997)

Authors
YU LG DAI JY XING ZP LI DX GUO JT YE HQ RAO JC ZHOU Y
Citation
Lg. Yu et al., HIGH-RESOLUTION ELECTRON-MICROSCOPY OBSERVATION OF INTERFACIAL STRUCTURES IN NIAL-MATRIX IN-SITU COMPOSITES REINFORCED BY TIC PARTICULATES (VOL 12, PG 1790, 1997), Journal of materials research, 12(11), 1997, pp. 3182-3182
Citations number
1
Categorie Soggetti
Material Science
Journal title
Journal of materials research → ACNP
ISSN journal
08842914
Volume
12
Issue
11
Year of publication
1997
Pages
3182 - 3182
Database
ISI
SICI code
0884-2914(1997)12:11<3182:HEOOIS>2.0.ZU;2-7