GEXSI1-X INFRARED DETECTORS .2. CARRIER ESCAPE PROBABILITY AND DETECTOR PERFORMANCE

Citation
R. Strong et al., GEXSI1-X INFRARED DETECTORS .2. CARRIER ESCAPE PROBABILITY AND DETECTOR PERFORMANCE, Journal of applied physics, 82(10), 1997, pp. 5199-5205
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
82
Issue
10
Year of publication
1997
Pages
5199 - 5205
Database
ISI
SICI code
0021-8979(1997)82:10<5199:GID.CE>2.0.ZU;2-K
Abstract
GexSi1-x/Si heterojunction internal photoemission (HIP) detectors with thresholds in the medium-wave infrared and long-wave infrared (LWIR) regions were fabricated and characterized. Measurements of the photore sponse are fit well by a theory which takes into account the scatterin g of excited carriers. The probability of escape of an excited hole is calculated and compared with that observed in another detector, the m ultiple quantum well structure. It is shown that HIP detectors can ach ieve background-limited performance in the LWIR region when operated a t 40 K. (C) 1997 American Institute of Physics.