Energies of basal-plane stacking faults in wurtzite AlN, GaN, and InN
are determined using a one-dimensional Ising-type model incorporating
effective layer-layer interactions obtained from density-functional-th
eory calculations. Stacking-fault energies are found to be largest for
AIN and smallest for GaN consistent with density-functional results f
or the wurtzite/zinc-blende energy differences. Estimates are also giv
en for stacking-fault energies in the zinc-blende structure. The value
s are negative, consistent with observations that nominal zinc-blende
films typically contain large numbers of stacking faults. A related re
sult is that hexagonal structures with stacking sequences repeating af
ter four and six bilayers have lower energies than zinc-blende for all
three compounds. (C) 1997 American Institute of Physics.