BASAL-PLANE STACKING-FAULTS AND POLYMORPHISM IN ALN, GAN, AND INN

Authors
Citation
Af. Wright, BASAL-PLANE STACKING-FAULTS AND POLYMORPHISM IN ALN, GAN, AND INN, Journal of applied physics, 82(10), 1997, pp. 5259-5261
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
82
Issue
10
Year of publication
1997
Pages
5259 - 5261
Database
ISI
SICI code
0021-8979(1997)82:10<5259:BSAPIA>2.0.ZU;2-B
Abstract
Energies of basal-plane stacking faults in wurtzite AlN, GaN, and InN are determined using a one-dimensional Ising-type model incorporating effective layer-layer interactions obtained from density-functional-th eory calculations. Stacking-fault energies are found to be largest for AIN and smallest for GaN consistent with density-functional results f or the wurtzite/zinc-blende energy differences. Estimates are also giv en for stacking-fault energies in the zinc-blende structure. The value s are negative, consistent with observations that nominal zinc-blende films typically contain large numbers of stacking faults. A related re sult is that hexagonal structures with stacking sequences repeating af ter four and six bilayers have lower energies than zinc-blende for all three compounds. (C) 1997 American Institute of Physics.