DETECTION OF MINOR CRYSTALLINE PHASES IN ALUMINA CERAMICS USING SYNCHROTRON-RADIATION DIFFRACTION

The use of synchrotron radiation diffraction (SRD) in conjunction with conventional laboratory X-ray diffraction (XRD) for analyzing the pha se assemblage of selected alumina-based ceramics is described. This pa per outlines the benefits of synchrotron powder diffraction in resolvi ng minor and impurity phases in various alumina ceramics. Laboratory X RD is shown to provide only cursory details of minor crystalline phase s which are strikingly evident and clearly defined from application of SRD analysis. The potential of SRD techniques to characterize low-lev el crystalline phases and as a check for ''phase purity'' in ceramic s ystems is considered.