USE OF ELECTRON-MICROSCOPY AND MICRODIFFRACTION FOR ZEOLITE FRAMEWORKCOMPARISON

Citation
S. Nicolopoulos et al., USE OF ELECTRON-MICROSCOPY AND MICRODIFFRACTION FOR ZEOLITE FRAMEWORKCOMPARISON, Journal of the American Chemical Society, 119(45), 1997, pp. 11000-11005
Citations number
27
Categorie Soggetti
Chemistry
ISSN journal
00027863
Volume
119
Issue
45
Year of publication
1997
Pages
11000 - 11005
Database
ISI
SICI code
0002-7863(1997)119:45<11000:UOEAMF>2.0.ZU;2-H
Abstract
Recent successful zeolite structure determination based on electron di ffraction and image analysis data shows interesting prospects to chara cterize zeolitic frameworks provided the crystals are thin enough to p roduce useful crystallographic phases from image analysis. Zeolite SSZ -25 and porosil ITQ-1 structures were compared to reveal if they are i somorphous to MCM-22 zeolite. By using electron microdiffraction inten sity data in the [0001] axis and phases extracted from HREM images tak en at different defocus conditions, the resulting projected [0001] pot ential maps are found to be very similar for both structures and close to that of the MCM-22 zeolite.