S. Nicolopoulos et al., USE OF ELECTRON-MICROSCOPY AND MICRODIFFRACTION FOR ZEOLITE FRAMEWORKCOMPARISON, Journal of the American Chemical Society, 119(45), 1997, pp. 11000-11005
Recent successful zeolite structure determination based on electron di
ffraction and image analysis data shows interesting prospects to chara
cterize zeolitic frameworks provided the crystals are thin enough to p
roduce useful crystallographic phases from image analysis. Zeolite SSZ
-25 and porosil ITQ-1 structures were compared to reveal if they are i
somorphous to MCM-22 zeolite. By using electron microdiffraction inten
sity data in the [0001] axis and phases extracted from HREM images tak
en at different defocus conditions, the resulting projected [0001] pot
ential maps are found to be very similar for both structures and close
to that of the MCM-22 zeolite.