ECL STORAGE ELEMENTS - MODELING OF FAULTY BEHAVIOR

Bipolar emitter coupled logic (ECL) devices can now be fabricated at v ery high densities and much lower pou er consumption. Behavior of two different ECL storage element implementations are examined in the pres ence of physical faults. While fault models for some implementations o f CMOS storage elements have been examined, not much attention has bee n paid to ECL storage elements, The conventional stuck-at fault model termed minimal fault model assumes that an input(output) of a storage element can he stuck-at-1 or 0. The minimal fault model may not model the behavior under certain physical failures in a storage element, The enhanced fault model providing higher coverage of physical failures i s presented.