RESONANT FIELD-IONIZATION - A NEW IMAGING MECHANISM IN THE FIELD-ION MICROSCOPE

Citation
Hj. Kreuzer et Rlc. Wang, RESONANT FIELD-IONIZATION - A NEW IMAGING MECHANISM IN THE FIELD-ION MICROSCOPE, Zeitschrift für physikalische Chemie, 202, 1997, pp. 127-138
Citations number
26
Categorie Soggetti
Chemistry Physical","Physics, Atomic, Molecular & Chemical
ISSN journal
09429352
Volume
202
Year of publication
1997
Part
1-2
Pages
127 - 138
Database
ISI
SICI code
0942-9352(1997)202:<127:RF-ANI>2.0.ZU;2-D
Abstract
The high image brightness of oxygen-covered Pt and Pd surfaces obtaine d in the field ion microscope with molecular oxygen as the imaging gas is explained as due to resonant field ionization. In contrast, clean and CO-covered field emitter surfaces have so far not been imaged with molecular oxygen. We present extensive calculations of field-induced adsorption based on density functional theory in the form of potential energy curves and contour plots of wave functions to make the argumen t for resonant field ionization. Some suggestions are made for which i maging,eases and surfaces resonant field ionization may be observed.