Fas. Soliman et al., COMPUTER DESIGN AND ANALYSIS OF RELAXATION-OSCILLATOR CIRCUITS APPLYING UNIJUNCTION TRANSISTORS, Microelectronics, 28(6-7), 1997, pp. 609-616
Performance data for unijunction transistor devices and their applicat
ions as oscillator circuits operate at normal and elevated temperature
levels (up to 140 degrees C) as well as in nuclear radiation environm
ents (up to 1000 Mrad) are presented either experimentally or theoreti
cally. Different computer programs are suggested to solve the general
equations for;he relaxation oscillators' design and analysis and to in
troduce the operating conditions, temperature and nuclear radiation ef
fects on their performance. It was found that the experimental and cal
culated data are in close agreement. (C) 1997 Elsevier Science Ltd.