IN-SITU X-RAY MEASUREMENTS OF LIGHT-CONTROLLED LAYER SPACING IN A SMECTIC-A LIQUID-CRYSTAL

Citation
Ta. Krentsel et al., IN-SITU X-RAY MEASUREMENTS OF LIGHT-CONTROLLED LAYER SPACING IN A SMECTIC-A LIQUID-CRYSTAL, Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals, 304, 1997, pp. 463-469
Citations number
10
Categorie Soggetti
Crystallography
ISSN journal
1058725X
Volume
304
Year of publication
1997
Pages
463 - 469
Database
ISI
SICI code
1058-725X(1997)304:<463:IXMOLL>2.0.ZU;2-7
Abstract
The smectic-A phase of octylcyanobiphenyl (8CB) doped with a photosens itive azo-compound has been reported to exhibit structural changes and formation of periodic layers distortions upon exposure to low-level r adiation. It is caused by changes in the smectic layer spacing trigger ed by light-induced molecular photoisomerization of the dopant azocomp ound. Our in-situ high resolution x-ray scattering study reveals that the light irradiation controls the smectic spacing. The exposure to UV light increases the layer spacing by as much as 0.5% (0.155 Angstrom for the studied mixture of 8CB and diheptylazobenzene 7AB at T = 24.00 degrees C). Irradiation by Be-Ne laser at 633 nm causes the contracti on of the layers.