CORRELATION OF SINGLE LUMEN SILICONE IMPLANT INTEGRITY WITH CHEMICAL-SHIFT ARTIFACT ON T2-WEIGHTED MR-IMAGES

Authors
MURPHY TJ PICCOLI CW
Citation
Tj. Murphy et Cw. Piccoli, CORRELATION OF SINGLE LUMEN SILICONE IMPLANT INTEGRITY WITH CHEMICAL-SHIFT ARTIFACT ON T2-WEIGHTED MR-IMAGES, Radiology, 205, 1997, pp. 1682-1682
Citations number
NO
Categorie Soggetti
Radiology,Nuclear Medicine & Medical Imaging
Journal title
Radiology → ACNP
ISSN journal
00338419
Volume
205
Year of publication
1997
Supplement
S
Pages
1682 - 1682
Database
ISI
SICI code
0033-8419(1997)205:<1682:COSLSI>2.0.ZU;2-U