LONG-TERM RELIABILITY OF AL-FREE INGAASP GAAS (LAMBDA=808 NM) LASERS AT HIGH-POWER HIGH-TEMPERATURE OPERATION/

Citation
J. Diaz et al., LONG-TERM RELIABILITY OF AL-FREE INGAASP GAAS (LAMBDA=808 NM) LASERS AT HIGH-POWER HIGH-TEMPERATURE OPERATION/, Applied physics letters, 71(21), 1997, pp. 3042-3044
Citations number
20
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
71
Issue
21
Year of publication
1997
Pages
3042 - 3044
Database
ISI
SICI code
0003-6951(1997)71:21<3042:LROAIG>2.0.ZU;2-E
Abstract
We report the long-term reliability measurement on uncoated Al-free In GaAsP/GaAs (lambda = 808 nm) lasers at high-power and high-temperature operation. No degradation in laser performance has been observed for over 30 000 h of lifetime testing in any of randomly selected several 100-mu m-wide uncoated lasers operated at 60 degrees C with 1 W contin uous wave output power. This is the:first and the most conclusive evid ence ever reported that directly shows the high long-term reliability of uncoated Al-free lasers. (C) 1997 American Institute of Physics.