MICROSTRUCTURE OF AL CONTACTS ON GAAS

Citation
I. Karpov et al., MICROSTRUCTURE OF AL CONTACTS ON GAAS, Applied physics letters, 71(21), 1997, pp. 3090-3092
Citations number
25
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
71
Issue
21
Year of publication
1997
Pages
3090 - 3092
Database
ISI
SICI code
0003-6951(1997)71:21<3090:MOACOG>2.0.ZU;2-B
Abstract
The microstructure of Al films deposited on GaAs(100) 2x4 surfaces thr ough chemical vapor deposition from dimethylethylamine alane in the 10 0-160 degrees C temperature range exhibits a dominant (111) texture wh ich is not encountered in evaporated films. Such a texture has been as sociated with enhanced electromigration resistance in related systems. Growth of (111)-oriented grains is observed when the deposition rate is limited by the surface reaction of the impinging precursor molecule s, while at higher temperatures (160-400 degrees C) only the conventio nal texture is observed. (C) 1997 American Institute of Physics.