The relative radiation resistance of the structures of zirconolite, py
rochlore and perovksite wore investigated by in situ transmission elec
tron microscopy using 1.5 MeV Kr+ ions in the HVEM-Tandem User Facilit
y, at Argonne National Laboratory. A suite of six fabricated zirconoli
tes, one fabricated pyrochlore and one natural perovskite was used. Da
mage accumulation essentially occurs in the same way in all three phas
es and is revealed by the following changes in SAD patterns: weakening
of superlattice Bragg diffraction maxima, appearance of diffuse rings
which increase in intensity with dose, disappearance of superlattice
or other specific classes of maxima, and disappearance of remaining su
blattice maxima leaving only diffuse rings. The average critical doses
for amorphisation (D-c) for all the zirconolites (undoped, Nd-doped,
U-doped and Th-doped) and the pyrochlore in this study varied by a fac
tor of similar to 2 (from 3.5 to 6.1 X 10(18) ions m(-2)). No correlat
ions were observed between D-c and the atomic weight of dopants in zir
conolite or the mean atomic weight of the sample. The D-c value at roo
m temperature of perovskite was found to be 1.8 X 10(19) ions m(-2), 3
-5 times the D-c values for zirconolite. This observation is in line w
ith what one expects from the topologic and chemical complexity of the
two phases and is compared with the results of previous authors. Prel
iminary assessment was made of EELS as a tool for monitoring radiation
damage. (C) 1997 Elsevier Science B.V.