Thin films of Aurivillius-type layered perovskites of Bi4Ti3O12 and Sr
Bi2Ta2O9 have been epitaxially deposited by PLD on SrTiO3 single cryst
al substrates. Bi4Ti3O12 has been deposited as well on a CeO2/YSZ/Si(1
00) buffer layer, and on Pt-coated oxidized silicon for electrical mea
surements. Using a new technique for large area PLD, Bi4Ti3O12 has als
o been deposited on a whole (100)-oriented 3 '' Si wafer. The obtained
films have a homogeneous thickness over the whole wafer corresponding
to an area of about 45 cm(2). The composition, structure, and electri
cal properties of the films are presented.