ANALYTICAL ELECTRON-MICROSCOPY OF FERROELECTRIC CERAMIC MATERIALS

Applications of analytical electron microscopy (TEM-EDXS) in investiga tions of ceramic ferroelectric materials are described and discussed. Emphasis is placed on various PZT and PLZT materials. Mixed oxide and sol-gel derived loose powder, bulk ceramic material and sol-gel derive d ferroelectric thin films on various substrates were analyzed and the degree of homogeneity was determined. The influence of TEM sample pre paration and the operating conditions of the transmission electron mic roscope on deterioration of crystal structure, deviation of chemical c omposition and the formation of a contamination layer are described an d discussed.